Title :
SUNBAR - A Universal Boundary Scan Architecture for a Sea-of-Gates Semi-Custom Environment
Author :
Büchner, T. ; Bernath, E. ; Gurkasch, R. ; Schwederski, T. ; Werkmann, H.
Author_Institution :
Inst. for Microelectron. Stuttgart, Stuttgart, Germany
Abstract :
A concept for a Standardized universal Boundary Scan Axchitecture for semi-custom sea of-gates ASICs (SUNBAR) is presented that complies with the IEEE 1149.1 standard and is extensible in a flexible way to control and observe a built-in (self) test of complex circuits. Using a fixed, extensible part with basic boundary scan functions integrated as a full custom circuitry on the master, and a part with enhanced functions placed on the semi-custom core of the chip, the architecture combines high flexibility with low area consumption. Be sides its boundary scan functionality, SUNBAR can be used as a front-end for structured design-for-testability measures like multiple scan paths, macro testing via hierarchical test controllers, BIST using PRPG/PSA circuitry, etc. SUNBAR supports all testable designs on the IMS Gate Forest, a 1.2μm sea-of-gates array.
Keywords :
IEEE standards; application specific integrated circuits; boundary scan testing; built-in self test; design for testability; logic gates; logic testing; BIST; IEEE 1149.1 standard; IMS Gate Forest; PRPG/PSA circuitry; SUNBAR; boundary scan functions; built-in self test; design-for-testability; hierarchical test controllers; macro testing; multiple scan paths; semi-custom sea of-gates ASIC; size 1.2 mum; standardized universal boundary scan architecture; Automatic testing; Built-in self-test; Circuit testing; Electrostatic discharge; Flexible printed circuits; Hardware; Integrated circuit measurements; Microelectronics; Power supplies; Semiconductor device measurement;
Conference_Titel :
Solid-State Circuits Conference, 1992. ESSCIRC '92. Eighteenth European
Conference_Location :
Copenhagen
Print_ISBN :
87-984232-0-7
DOI :
10.1109/ESSCIRC.1992.5468166
