Title :
Time-resolved emission testing challenges for low voltage CMOS technologies
Author :
Song, Peilin ; Stellari, Franco ; Manus, Moyra K Mc
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
The advances of CMOS technologies have challenged the time-resolved emission testing and diagnostics of certain applications. This paper addresses these challenges from both emission tooling and chip design perspective.
Keywords :
CMOS integrated circuits; integrated circuit design; integrated circuit technology; integrated optoelectronics; superconducting photodetectors; time resolved spectra; CMOS technology; chip design; emission tooling; time-resolved emission diagnostics; time-resolved emission testing; CMOS technology; Detectors; Lenses; Low voltage; Optical filters; Optical imaging; Optical sensors; Space technology; Stimulated emission; Testing;
Conference_Titel :
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
Print_ISBN :
0-7803-7888-1
DOI :
10.1109/LEOS.2003.1252941
