DocumentCode :
2399886
Title :
Shallow trap modelling of infrared sensitive BaTiO3
Author :
Ross, G.W. ; Eason, Robert W. ; Damzen, M.J. ; Ramos-Garcia, Raul ; Garrett, M.H. ; Rytz, D.
fYear :
1994
fDate :
28 Aug-2 Sep 1994
Firstpage :
362
Lastpage :
363
Keywords :
Crystalline materials; Crystals; Dielectrics; Electric variables measurement; Electron traps; Optical materials; Optical sensors; Photorefractive effect; Photorefractive materials; Stress measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe, 1994 Conference on
Print_ISBN :
0-7803-1789-0
Type :
conf
DOI :
10.1109/CLEOE.1994.636641
Filename :
636641
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2399886
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