DocumentCode :
2400241
Title :
Two-level approach for solving the inverse problem of defect identification in eddy current testing-type NDT
Author :
Putek, Piotr ; Crevecoeur, Guillaume ; Slodicka, Marian ; Gawrylczyk, Konstanty ; van Keer, Roger ; Dupre, Luc
Author_Institution :
NaM2 Research Group, Department of Mathematical Analysis, Ghent University, B-9000, Belgium
fYear :
2011
fDate :
11-14 April 2011
Firstpage :
1
Lastpage :
2
Abstract :
An inverse problem of 3D crack identification inside a conductive material from the eddy current measurements is investigated. In order to accelerate the time-consuming direct optimization, the reconstruction is provided by the minimization of a last-square functional of the data-model misfit using space mapping (SM) methodology. This technique enables to shift the optimization load from a time consuming and accurate model to the less precise but faster coarse surrogate. In this work, the finite element method (FEM) is used as a fine model, while the model based on the volume integral method (VIM) serves as a coarse model. The application of this method to the shape reconstruction allows to shorten the evaluation time that is required to provide the proper parameter estimation of surface defects.
Keywords :
defect identification; eddy current testing method; sensitivity analysis; two-level optimization techniques;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Computation in Electromagnetics (CEM 2011), IET 8th International Conference on
Conference_Location :
Wroclaw
Type :
conf
DOI :
10.1049/cp.2011.0071
Filename :
6085492
Link To Document :
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