Title :
Boosting ordinal features for accurate and fast iris recognition
Author :
He, Zhaofeng ; Sun, Zhenan ; Tan, Tieniu ; Qiu, Xianchao ; Zhong, Cheng ; Dong, Wenbo
Author_Institution :
Center for Biometrics & Security Res., Chinese Acad. of Sci., Beijing
Abstract :
In this paper, we present a novel iris recognition method based on learned ordinal features.Firstly, taking full advantages of the properties of iris textures, a new iris representation method based on regional ordinal measure encoding is presented, which provides an over-complete iris feature set for learning. Secondly, a novel Similarity Oriented Boosting (SOBoost) algorithm is proposed to train an efficient and stable classifier with a small set of features. Compared with Adaboost, SOBoost is advantageous in that it operates on similarity oriented training samples, and therefore provides a better way for boosting strong classifiers. Finally, the well-known cascade architecture is adopted to reorganize the learned SOBoost classifier into a dasiacascadepsila, by which the searching ability of iris recognition towards large-scale deployments is greatly enhanced. Extensive experiments on two challenging iris image databases demonstrate that the proposed method achieves state-of-the-art iris recognition accuracy and speed. In addition, SOBoost outperforms Adaboost (Gentle-Adaboost, JS-Adaboost, etc.) in terms of both accuracy and generalization capability across different iris databases.
Keywords :
biometrics (access control); encoding; eye; image recognition; image representation; learning (artificial intelligence); Adaboost; SOBoost; cascade architecture; iris databases; iris image databases; iris representation method; ordinal features boosting; regional ordinal measure encoding; similarity oriented boosting algorithm; state-of-the-art iris recognition accuracy; Biometrics; Boosting; Helium; Image databases; Iris recognition; Large-scale systems; Machine learning algorithms; National security; Spatial databases; Sun;
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2008.4587645