• DocumentCode
    2400706
  • Title

    Non-negative graph embedding

  • Author

    Yang, Jianchao ; Yang, Shuicheng ; Fu, Yun ; Li, Xuelong ; Huang, Thomas

  • Author_Institution
    Dept. of ECE, Univ. of Illinois at Urbana-Champaign, Urbana, IL
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    We introduce a general formulation, called non-negative graph embedding, for non-negative data decomposition by integrating the characteristics of both intrinsic and penalty graphs [17]. In the past, such a decomposition was obtained mostly in an unsupervised manner, such as Non-negative Matrix Factorization (NMF) and its variants, and hence unnecessary to be powerful at classification. In this work, the non-negative data decomposition is studied in a unified way applicable for both unsupervised and supervised/semi-supervised configurations. The ultimate data decomposition is separated into two parts, which separatively preserve the similarities measured by the intrinsic and penalty graphs, and together minimize the data reconstruction error. An iterative procedure is derived for such a purpose, and the algorithmic non-negativity is guaranteed by the non-negative property of the inverse of any M-matrix. Extensive experiments compared with NMF and conventional solutions for graph embedding demonstrate the algorithmic properties in sparsity, classification power, and robustness to image occlusions.
  • Keywords
    graph theory; iterative methods; intrinsic graph; iterative procedure; nonnegative data decomposition; nonnegative graph embedding; penalty graph; Feature extraction; Image reconstruction; Iterative algorithms; Matrix decomposition; Pattern recognition; Principal component analysis; Psychology; Robustness; Scattering; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-2242-5
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2008.4587665
  • Filename
    4587665