DocumentCode
2400751
Title
The HDR-RF test waveform - an innovative risk reduction product for FPGA-based SATCOM modems
Author
Torres, Jose
Author_Institution
MITRE Corp., Bedford, MA
fYear
2008
fDate
16-19 Nov. 2008
Firstpage
1
Lastpage
6
Abstract
Transponded Ka-band military satellite communications (SATCOM) enables airborne Intelligence, Surveillance, and Reconnaissance (ISR) platforms, such as the Global Hawk unmanned aerial vehicle (UAV), to deliver up to 274 Mbps of high data rate sensor information to beyond line-of-sight (BLOS) ground terminals. The high data rate radio frequency (HDR-RF) ground modem program has leveraged the MITRE programmable radio technology (PRT) laboratory to provide an innovative approach that has enabled development of the HDR-RF ground modem long before availability of the Ka-band operational waveform. This capability is critical to providing the government confidence the HDR-RF ground modems are designed with adequate resources to host the operational waveform in the future. This paper describes the developed risk reduction product consisting of a powerful reuse strategy for waveforms implemented using field programmable gate array (FPGA) devices, a complex high data rate (HDR) test waveform, and a test asset used as the gold standard for interoperability testing with the HDR-RF ground modems.
Keywords
field programmable gate arrays; military communication; modems; satellite communication; FPGA-based SATCOM modems; Global Hawk unmanned aerial vehicle; HDR-RF test waveform; Ka-band military satellite communications; Ka-band operational waveform; beyond line-of-sight ground terminals; field programmable gate array; high data rate radio frequency; high data rate sensor information; risk reduction product; Field programmable gate arrays; Intelligent sensors; Intelligent vehicles; Military satellites; Modems; Reconnaissance; Risk management; Surveillance; Testing; Unmanned aerial vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Military Communications Conference, 2008. MILCOM 2008. IEEE
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-2676-8
Electronic_ISBN
978-1-4244-2677-5
Type
conf
DOI
10.1109/MILCOM.2008.4753501
Filename
4753501
Link To Document