• DocumentCode
    2400785
  • Title

    An iterative outlier screening procedure for reliability data using mixed effect modeling

  • Author

    Jayanarayanan, S.K. ; Hu, Helen ; McGaughey, Karen

  • Author_Institution
    Adv. Micro Devices, Sunnyvale, CA, USA
  • fYear
    2009
  • fDate
    10-12 May 2009
  • Firstpage
    112
  • Lastpage
    114
  • Abstract
    We present an outlier screening procedure that has been used to remove outliers in NBTI (Negative Bias Temperature Instability) data, using the statistical approach of Mixed Effect Modeling. Our method has proven very useful with its inherent values on two aspects. First, it removes outliers that are considered to be deviating from the regression line at individual stress conditions. Second, it may avoid pitfalls in the traditional univariate method where valid data-points are incorrectly detected as outliers, especially with very few samples per stress condition.
  • Keywords
    iterative methods; regression analysis; reliability; semiconductor device models; NBTI; data-points; individual stress conditions; iterative outlier screening procedure; mixed effect modeling; negative bias temperature instability; regression line; reliability data; Equations; MOSFET circuits; Negative bias temperature instability; Niobium compounds; Predictive models; Statistical distributions; Stress measurement; Testing; Threshold voltage; Titanium compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2009. ASMC '09. IEEE/SEMI
  • Conference_Location
    Berlin
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4244-3614-9
  • Electronic_ISBN
    1078-8743
  • Type

    conf

  • DOI
    10.1109/ASMC.2009.5155967
  • Filename
    5155967