DocumentCode
2400785
Title
An iterative outlier screening procedure for reliability data using mixed effect modeling
Author
Jayanarayanan, S.K. ; Hu, Helen ; McGaughey, Karen
Author_Institution
Adv. Micro Devices, Sunnyvale, CA, USA
fYear
2009
fDate
10-12 May 2009
Firstpage
112
Lastpage
114
Abstract
We present an outlier screening procedure that has been used to remove outliers in NBTI (Negative Bias Temperature Instability) data, using the statistical approach of Mixed Effect Modeling. Our method has proven very useful with its inherent values on two aspects. First, it removes outliers that are considered to be deviating from the regression line at individual stress conditions. Second, it may avoid pitfalls in the traditional univariate method where valid data-points are incorrectly detected as outliers, especially with very few samples per stress condition.
Keywords
iterative methods; regression analysis; reliability; semiconductor device models; NBTI; data-points; individual stress conditions; iterative outlier screening procedure; mixed effect modeling; negative bias temperature instability; regression line; reliability data; Equations; MOSFET circuits; Negative bias temperature instability; Niobium compounds; Predictive models; Statistical distributions; Stress measurement; Testing; Threshold voltage; Titanium compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference, 2009. ASMC '09. IEEE/SEMI
Conference_Location
Berlin
ISSN
1078-8743
Print_ISBN
978-1-4244-3614-9
Electronic_ISBN
1078-8743
Type
conf
DOI
10.1109/ASMC.2009.5155967
Filename
5155967
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