DocumentCode :
2400785
Title :
An iterative outlier screening procedure for reliability data using mixed effect modeling
Author :
Jayanarayanan, S.K. ; Hu, Helen ; McGaughey, Karen
Author_Institution :
Adv. Micro Devices, Sunnyvale, CA, USA
fYear :
2009
fDate :
10-12 May 2009
Firstpage :
112
Lastpage :
114
Abstract :
We present an outlier screening procedure that has been used to remove outliers in NBTI (Negative Bias Temperature Instability) data, using the statistical approach of Mixed Effect Modeling. Our method has proven very useful with its inherent values on two aspects. First, it removes outliers that are considered to be deviating from the regression line at individual stress conditions. Second, it may avoid pitfalls in the traditional univariate method where valid data-points are incorrectly detected as outliers, especially with very few samples per stress condition.
Keywords :
iterative methods; regression analysis; reliability; semiconductor device models; NBTI; data-points; individual stress conditions; iterative outlier screening procedure; mixed effect modeling; negative bias temperature instability; regression line; reliability data; Equations; MOSFET circuits; Negative bias temperature instability; Niobium compounds; Predictive models; Statistical distributions; Stress measurement; Testing; Threshold voltage; Titanium compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2009. ASMC '09. IEEE/SEMI
Conference_Location :
Berlin
ISSN :
1078-8743
Print_ISBN :
978-1-4244-3614-9
Electronic_ISBN :
1078-8743
Type :
conf
DOI :
10.1109/ASMC.2009.5155967
Filename :
5155967
Link To Document :
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