• DocumentCode
    240080
  • Title

    Extreme wide-temperature range 8-bit digital to analog converter in bulk CMOS process

  • Author

    Greig, Kevin S. ; Chodavarapu, Vamsy P.

  • fYear
    2014
  • fDate
    4-7 May 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    An 8-bit 20k samples-per-second digital-to-analog converter (DAC) capable of operating within the extreme wide-temperature range was developed in a 130nm bulk CMOS technology. Emphasis was placed on the design of a temperature insensitive operational amplifier (op-amp) used in DAC. A novel approach for common mode-feedback with a nested miller compensation op-amp was used in combination with other established methods to mitigate the negative effects of high temperatures on bulk CMOS devices. At 225 °C, the op-amp had a power consumption of 647 μW, with a DC gain of 76 dB, a unity gain bandwidth of 56.8 MHz and a phase margin of 100 degrees. The functionality of the 8-bit DAC was characterized at all operating corners over the extreme wide-temperature range.
  • Keywords
    CMOS integrated circuits; digital-analogue conversion; operational amplifiers; bulk CMOS process; digital-analog converter; extreme wide temperature range DAC; gain 76 dB; power 647 muW; size 130 nm; temperature 225 C; temperature insensitive operational amplifier; Data models; Digital-analog conversion; Gain; Power demand; Resistors; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering (CCECE), 2014 IEEE 27th Canadian Conference on
  • Conference_Location
    Toronto, ON
  • ISSN
    0840-7789
  • Print_ISBN
    978-1-4799-3099-9
  • Type

    conf

  • DOI
    10.1109/CCECE.2014.6901016
  • Filename
    6901016