• DocumentCode
    2400805
  • Title

    Do the stars align? Multidimensional analysis of Android´s layered architecture

  • Author

    Guana, Victor ; Rocha, Fabio ; Hindle, Abram ; Stroulia, Eleni

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Alberta, Edmonton, AB, Canada
  • fYear
    2012
  • fDate
    2-3 June 2012
  • Firstpage
    124
  • Lastpage
    127
  • Abstract
    In this paper we mine the Android bug tracker repository and study the characteristics of the architectural layers of the Android system. We have identified the locality of the Android bugs in the architectural layers of the its infrastructure, and analysed the bug lifetime patterns in each one of them. Additionally, we mined the bug tracker reporters and classified them according to its social centrality in the Android bug tracker community. We report three interesting findings, firstly while some architectural layers have a diverse interaction of people, attracting not only non-central reporters but highly important ones, other layers are mostly captivating for peripheral actors. Second, we exposed that even the bug lifetime is similar across the architectural layers, some of them have higher bug density and differential percentages of unsolved bugs. Finally, comparing the popularity distribution between layers, we have identified one particular layer that is more important to developers and users alike.
  • Keywords
    data mining; mobile computing; operating systems (computers); program debugging; software architecture; Android bug tracker repository; Android layered architecture; Android operating system; Android system; architectural layers; bug lifetime pattern analysis; mobile devices; multidimensional analysis; popularity distribution; software services; Androids; Communities; Computer bugs; Humanoid robots; Kernel; Libraries; Runtime; architectural layer; bug tracker; lifetime; social centrality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mining Software Repositories (MSR), 2012 9th IEEE Working Conference on
  • Conference_Location
    Zurich
  • ISSN
    2160-1852
  • Print_ISBN
    978-1-4673-1760-3
  • Type

    conf

  • DOI
    10.1109/MSR.2012.6224269
  • Filename
    6224269