Title :
Yield optimization of analog ICs using 2-step analytic modeling methods
Author :
Guardiani, Carlo ; Scandolara, Primo ; Benkoski, Jacques ; Nicollini, Germano
Author_Institution :
SGS-Thomson Microelectron., Agrate Brianza, Italy
Abstract :
We applied two innovative methods for statistical design optimization in the design of a CMOS OP-AMP. The most important feature of these methods is the derivation of an analytic function representing the yield surface in the design parameters space. All the required operations are implemented in an integrated CAD system and fully automatized. The results are compared with measures on several wafer lots.
Keywords :
CMOS analogue integrated circuits; circuit CAD; circuit optimisation; integrated circuit yield; operational amplifiers; statistical analysis; 2-step analytic modeling method; CMOS op-amp; analog IC; design parameter space; integrated CAD system; wafer lots; yield optimization; Circuit simulation; Design automation; Design for experiments; Design optimization; Integrated circuit modeling; Optimization methods; Pluto; Polynomials; Random variables; Response surface methodology;
Conference_Titel :
Solid-State Circuits Conference, 1992. ESSCIRC '92. Eighteenth European
Conference_Location :
Copenhagen
Print_ISBN :
87-984232-0-7
DOI :
10.1109/ESSCIRC.1992.5468265
