Bit string analysis of Physical Unclonable Functions based on resistance variations in metals and transistors

Author

Ju, Jing ; Plusquellic, Jim ; Chakraborty, Raj ; Rad, Reza

Author_Institution

Univ. of New Mexico, Albuquerque, NM, USA

fYear

2012

fDate

3-4 June 2012

Firstpage

13

Lastpage

20

Abstract

Security mechanisms such as encryption, authentication and feature activation depend on the integrity of embedded secret keys. The mechanism by which these `digital secrets´ are stored within Integrated Circuits (ICs) is changing from EPROMs and/or fuse technology to Physical Unclonable Functions (PUFs). PUFs leverage the naturally occurring manufacturing variations within each IC to produce repeatedly random digital identifiers. In this paper, we analyze the quality of the bit strings generated by PUFs that leverage resistance variations in 1) the power grid metal wires and transistor on-resistance in 60 copies of a 90 nm chip and 2) in the power grid metal wires of 58 copies of a 65 nm chip.

Keywords

EPROM; integrated circuit manufacture; public key cryptography; EPROM; PUF; authentication; bit string analysis; bit strings quality; digital secrets; embedded secret keys; encryption; feature activation; fuse technology; integrated circuits; metals; naturally occurring manufacturing variations; physical unclonable functions; power grid metal wires; repeatedly random digital identifiers; resistance variations; security mechanisms; size 65 nm; size 90 nm; transistor on-resistance; transistors; Arrays; Metals; Power grids; Resistance; Semiconductor device measurement; Voltage measurement; Wires; Physical Unclonable Function; metal resistance variations; power grid;

fLanguage

English

Publisher

ieee

Conference_Titel

Hardware-Oriented Security and Trust (HOST), 2012 IEEE International Symposium on

Conference_Location

San Francisco, CA

Print_ISBN

978-1-4673-2341-3

Type

conf

DOI

10.1109/HST.2012.6224312

Filename

6224312