Title :
Test socket chip for measuring dark currents in IR FPA
Author :
Sheu, Meng Lieh ; Sun, Tai Ping ; Jih, Far-Wen
Abstract :
A test socket chip for measuring dark currents of infrared (IR) detectors in a focal plane array (FPA) is presented in this paper. A calibration scheme adopted in this chip to cancel the leakage current due to OFF-state MOS switches tied to the measuring path is also demonstrated
Keywords :
calibration; dark conductivity; focal planes; infrared detectors; leakage currents; IR FPA; OFF-state MOS switches; calibration scheme; dark currents; infrared detectors; leakage current; measuring path; test socket chip; Calibration; Current measurement; Dark current; Infrared detectors; Leakage current; Semiconductor device measurement; Sensor arrays; Sockets; Switches; Testing;
Conference_Titel :
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location :
Christchurch
Print_ISBN :
0-7695-1453-7
DOI :
10.1109/DELTA.2002.994608
