Title :
Contourlet domain image denoising using normal inverse gaussian distribution
Author :
Sadreazami, H. ; Ahmad, M. Omair ; Swamy, M.N.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
Abstract :
A new contourlet-based method is introduced for reducing noise in images corrupted by additive white Gaussian noise. It is shown that a symmetric normal inverse Gaussian distribution is more suitable for modeling the contourlet coefficients than formerly-used generalized Gaussian distribution. To estimate the noise-free coefficients, a Bayesian maximum a posteriori estimator is developed utilizing the proposed distribution. In order to estimate the parameters of the distribution, a moment-based technique is used. The performance of the proposed method is studied using typical noise-free images corrupted with simulated noise and compared with that of the other state-of-the-art methods. It is shown that compared with other denoising techniques, the proposed method gives higher values of the peak signal-to-noise ratio and provides images of good visual quality.
Keywords :
AWGN; Bayes methods; Gaussian distribution; image denoising; maximum likelihood estimation; Bayesian maximum a posteriori estimator; additive white Gaussian noise; contourlet domain image denoising; moment-based technique; noise-free coefficient estimation; noise-free images; normal inverse gaussian distribution; signal-to-noise ratio; Bayes methods; Gaussian distribution; Image denoising; Noise; Noise measurement; Noise reduction; Transforms; Contourlet transform; image denoising; maximum a posterior estimator; normal inverse Gaussian distribution;
Conference_Titel :
Electrical and Computer Engineering (CCECE), 2014 IEEE 27th Canadian Conference on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4799-3099-9
DOI :
10.1109/CCECE.2014.6901077