DocumentCode :
2402168
Title :
Learning patch correspondences for improved viewpoint invariant face recognition
Author :
Ashraf, Ahmed Bilal ; Lucey, Simon ; Chen, Tsuhan
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA
fYear :
2008
fDate :
23-28 June 2008
Firstpage :
1
Lastpage :
8
Abstract :
Variation due to viewpoint is one of the key challenges that stand in the way of a complete solution to the face recognition problem. It is easy to note that local regions of the face change differently in appearance as the viewpoint varies. Recently, patch-based approaches, such as those of Kanade and Yamada, have taken advantage of this effect resulting in improved viewpoint invariant face recognition. In this paper we propose a data-driven extension to their approach, in which we not only model how a face patch varies in appearance, but also how it deforms spatially as the viewpoint varies. We propose a novel alignment strategy which we refer to as ldquostack flowrdquo that discovers viewpoint induced spatial deformities undergone by a face at the patch level. One can then view the spatial deformation of a patch as the correspondence of that patch between two viewpoints. We present improved identification and verification results to demonstrate the utility of our technique.
Keywords :
face recognition; alignment strategy; patch correspondences; spatial deformation; stackflow; viewpoint invariant face recognition; Deformable models; Face recognition; Geometry; Head; Humans; Image recognition; Lighting; Nose; Power system modeling; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
ISSN :
1063-6919
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2008.4587754
Filename :
4587754
Link To Document :
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