Title :
Boundary reconstruction of completely conductive inclusions by Electrical resistance tomography
Author :
Chao Tan ; Yaoyuan Xu ; Feng Dong
Author_Institution :
Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China
Abstract :
Determining the boundary of inclusions within an opaque vessel sometimes is of more interest to academic research and industrial application than conductivity distribution when applying Process tomography. This work focuses on reconstructing the boundary of completely conductive inclusions by Boundary Element Method with Electrical resistance tomography (ERT). The integral equations of forward problem are reformed since they are not identical as those for low conductivity. Inverse problem is solved with Levenberg-Marquardt (L-M) Algorithm. The results are verified with numerical simulations and errors have shown acceptable.
Keywords :
boundary-elements methods; electric field integral equations; electric resistance measurement; inverse problems; tomography; Levenberg-Marquardt algorithm; academic research; boundary element method; completely conductive inclusion boundary reconstruction; conductivity distribution; electrical resistance tomography; industrial application; integral equation; inverse problem; numerical error; numerical simulation; opaque vessel; process tomography; Conductivity; Contact resistance; Electrodes; Integral equations; Jacobian matrices; Mathematical model; Tomography; Levenberg-Marquardt; boundary element method; boundary reconstruction; completely conductive inclusions; electrical resistmography;
Conference_Titel :
Imaging Systems and Techniques (IST), 2011 IEEE International Conference on
Conference_Location :
Penang
Print_ISBN :
978-1-61284-894-5
DOI :
10.1109/IST.2011.5962173