DocumentCode :
2402368
Title :
The effects of wipe on contact resistance of aged surfaces
Author :
Malucci, Robert D.
Author_Institution :
Molex Inc., Lisle, IL, USA
fYear :
1994
fDate :
17-19 Oct. 1994
Firstpage :
131
Lastpage :
144
Abstract :
Probe measurements were made on corroded test coupons to show the effects wipe have on contact resistance. Data are provided for two types of films; oxidized copper and corrosion on porous gold due to flowing mixed gas tests (FMG). The results in both cases show contact resistance is reduced by nearly two orders of magnitude for 0.25 mm wipe. In addition, a Monte Carlo analysis was conducted using a modified version of a previously developed model of degradation. This included; adding film resistivity as a random variable for asperities that were previously considered non-conductive, and incorporating wipe in the model by considering shear forces to produce additional asperity deformation. The Monte Carlo results agree reasonably well with observation as differences can be explained within the framework of the model. It is believed improvements can be made on the predictions of the model if the mechanism of film removal and adhesion, and the variation of film resistivity are better understood.
Keywords :
Monte Carlo methods; ageing; contact resistance; corrosion; oxidation; surface cleaning; Au; Cu; Monte Carlo analysis; adhesion; aged surfaces; asperity deformation; contact resistance; corrosion; degradation; film resistivity; flowing mixed gas tests; oxidized copper; porous gold; probes; shear forces; wipe; Aging; Conductivity; Contact resistance; Copper; Corrosion; Electrical resistance measurement; Monte Carlo methods; Probes; Surface resistance; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1994. Proceedings of the Fortieth IEEE Holm Conference on Electrical Contacts
Print_ISBN :
0-7803-2133-2
Type :
conf
DOI :
10.1109/HOLM.1994.636830
Filename :
636830
Link To Document :
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