Title :
Investigation of nickel-nickel contacts in portable computer battery pack applications
Author :
Lei, Kuan-Shaur ; Brownell, Paul V.
Author_Institution :
Adv. Manuf. & Mater. Technol., Compaq Comput. Corp., Houston, TX, USA
Abstract :
Recent advances in the portable computer industry have increased the demands on battery pack performance and intensified interest in the long-term reliability of battery contacts. This paper characterizes the relation between contact resistance and force of the popular Ni-Ni contact interface at various stages of oxidation. The virgin Ni-Ni interface exhibited contact resistances of less than 30 mΩ at contact forces greater than 40 g. However, contacts exposed to a Battelle Class II mixed flowing gas (MFG) environment for up to six days and contacts subjected to 85°C/85% RH conditions for 500 bouts showed resistances as high as 200 Ω at 150 g and 1 kΩ at 100 g. The effects of repeated mating and wiping also were evaluated; fifty cycles of repeated mating at contact forces up to 150 g did not make a discernable difference but a single wipe at 150 g reduced the contact resistance significantly.
Keywords :
cells (electric); computer power supplies; contact resistance; environmental degradation; nickel; oxidation; portable computers; 500 hour; 85 C; Battelle Class II mixed flowing gas; Ni-Ni; contact forces; contact resistance; mating; nickel-nickel contact interface; oxidation; portable computer battery pack; relative humidity; reliability; wiping; Aging; Application software; Batteries; Circuits; Computer aided manufacturing; Computer industry; Contact resistance; Electrical resistance measurement; Nickel; Portable computers;
Conference_Titel :
Electrical Contacts, 1994. Proceedings of the Fortieth IEEE Holm Conference on Electrical Contacts
Print_ISBN :
0-7803-2133-2
DOI :
10.1109/HOLM.1994.636832