A novel analytical model for evaluation of substrate crosstalk in VLSI circuits

Accurate and fast evaluation of substrate coupled noise has become a key-factor in today´s mixed-signal RF IC design. In this work, we present efficient and closed-form analytical solutions for modeling substrate coupling in VLSI circuits. Using Maxwell´s equations and the Green´s theorem an integral equation for the extraction of substrate parasitic elements is developed. We utilize a fast-convergent Green´s function in the integral equation. We also derive analytical solutions for the fourfold integrals of the Green´s function. Finally, the impact of using the proposed models on the speed up of the computations required for the extraction process is demonstrated