Title :
A novel analytical model for evaluation of substrate crosstalk in VLSI circuits
Author :
Masoumi, Nasser ; Elmasry, Mohamed I. ; Safavi-Naeini, Safieddin ; Hadi, Haydar
Author_Institution :
VLSI Res. Group, Waterloo Univ., Ont., Canada
Abstract :
Accurate and fast evaluation of substrate coupled noise has become a key-factor in today´s mixed-signal RF IC design. In this work, we present efficient and closed-form analytical solutions for modeling substrate coupling in VLSI circuits. Using Maxwell´s equations and the Green´s theorem an integral equation for the extraction of substrate parasitic elements is developed. We utilize a fast-convergent Green´s function in the integral equation. We also derive analytical solutions for the fourfold integrals of the Green´s function. Finally, the impact of using the proposed models on the speed up of the computations required for the extraction process is demonstrated
Keywords :
Green´s function methods; MMIC; Maxwell equations; UHF integrated circuits; VLSI; circuit simulation; crosstalk; integral equations; integrated circuit modelling; integrated circuit noise; mixed analogue-digital integrated circuits; Green´s theorem; IC design; Maxwell´s equations; VLSI; analytical model; closed-form analytical solutions; coupled noise; extraction process; fast-convergent Green´s function; fourfold integrals; integral equation; mixed-signal RF IC; parasitic elements; substrate crosstalk; Analytical models; Coupling circuits; Crosstalk; Green´s function methods; Integral equations; Integrated circuit noise; Maxwell equations; Radio frequency; Radiofrequency integrated circuits; Very large scale integration;
Conference_Titel :
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location :
Christchurch
Print_ISBN :
0-7695-1453-7
DOI :
10.1109/DELTA.2002.994649
