DocumentCode :
2403029
Title :
Simultaneous super-resolution and feature extraction for recognition of low-resolution faces
Author :
Hennings-Yeomans, Pablo H. ; Baker, Simon ; Kumar, B. V K Vijaya
Author_Institution :
ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA
fYear :
2008
fDate :
23-28 June 2008
Firstpage :
1
Lastpage :
8
Abstract :
Face recognition degrades when faces are of very low resolution since many details about the difference between one person and another can only be captured in images of sufficient resolution. In this work, we propose a new procedure for recognition of low-resolution faces, when there is a high-resolution training set available. Most previous super-resolution approaches are aimed at reconstruction, with recognition only as an after-thought. In contrast, in the proposed method, face features, as they would be extracted for a face recognition algorithm (e.g., eigenfaces, Fisher-faces, etc.), are included in a super-resolution method as prior information. This approach simultaneously provides measures of fit of the super-resolution result, from both reconstruction and recognition perspectives. This is different from the conventional paradigms of matching in a low-resolution domain, or, alternatively, applying a super-resolution algorithm to a low-resolution face and then classifying the super-resolution result. We show, for example, that recognition of faces of as low as 6 times 6 pixel size is considerably improved compared to matching using a super-resolution reconstruction followed by classification, and to matching with a low-resolution training set.
Keywords :
face recognition; feature extraction; image matching; image resolution; face recognition; feature extraction; low resolution faces; super resolution algorithm; Data mining; Degradation; Face recognition; Feature extraction; Image reconstruction; Image resolution; Interpolation; Probes; Surveillance; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
ISSN :
1063-6919
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2008.4587810
Filename :
4587810
Link To Document :
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