Title :
Enhancing the static D.C. fault diagnosis of a Resistance Temperature Detector sensor circuit using equivalent fault analysis
Author :
Worsman, Matthew ; Wong, Mike W T ; Lee, Y.S.
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., China
Abstract :
Analysis of equivalent single parametric component faults in a Resistance-Temperature-Detector (RTD) sensor circuit under steady-state d.c. condition is used to systematically adjust component parameters for enhanced fault diagnosis. Component tolerances are accounted for when evaluating the effectiveness of the proposed changes
Keywords :
fault diagnosis; temperature sensors; tolerance analysis; equivalent fault analysis; resistance temperature detector sensor circuit; single parametric component; static DC fault diagnosis; tolerance analysis; Circuit faults; Circuit testing; Detectors; Electrical fault detection; Fault detection; Fault diagnosis; Frequency; Steady-state; Temperature sensors; Voltage;
Conference_Titel :
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location :
Christchurch
Print_ISBN :
0-7695-1453-7
DOI :
10.1109/DELTA.2002.994669
