• DocumentCode
    2403265
  • Title

    A new transitive closure algorithm with application to redundancy identification

  • Author

    Gaur, Vivek ; Agrawal, Vishwani D. ; Bushnell, Michael L.

  • Author_Institution
    Avant! Corp., Fremont, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    496
  • Lastpage
    500
  • Abstract
    A new transitive closure algorithm is presented for implication graphs that contain partial implications. In the presence of partial implications, a vertex can assume the true state when all vertices that partially imply it become true. Such graphs provide a more complete representation of a logic circuit than is possible with the conventional pair-wise implications. An application of the new transitive closure algorithm to redundancy identification shows significantly improved results. Empirically, we find the computational complexity of transitive closure to be linear for the implication graphs of the ISCAS benchmark circuits
  • Keywords
    automatic test pattern generation; combinational circuits; communication complexity; graph theory; logic testing; redundancy; ISCAS benchmark circuits; computational complexity; implication graphs; logic circuit; partial implications; redundancy identification; transitive closure algorithm; vertex; Chromium; Conferences; Electronic equipment testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
  • Conference_Location
    Christchurch
  • Print_ISBN
    0-7695-1453-7
  • Type

    conf

  • DOI
    10.1109/DELTA.2002.994683
  • Filename
    994683