DocumentCode
2403337
Title
Fabric defect classification using wavelet frames and minimum classification error training
Author
Yang, Xuezhi ; Pang, Grantham ; Yung, Nelson
Author_Institution
Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
Volume
1
fYear
2002
fDate
13-18 Oct. 2002
Firstpage
290
Abstract
This paper proposes a new method for fabric defect classification by incorporating the design of a wavelet frames based feature extractor with the design of a Euclidean distance based classifier. Channel variances at the outputs of the wavelet frame decomposition are used to characterize each nonoverlapping window of the fabric image. A feature extractor using linear transformation matrix is further employed to extract the classification-oriented features. With a Euclidean distance based classifier, each nonoverlapping window of the fabric image is then assigned to its corresponding category. Minimization of the classification error is achieved by incorporating the design of the feature extractor with the design of the classifier based on minimum classification error (MCE) training method. The proposed method has been evaluated on the classification of 329 defect samples containing nine classes of fabric defects, and 328 nondefect samples, where 93.1% classification accuracy has been achieved.
Keywords
automatic optical inspection; fault location; feature extraction; image classification; learning (artificial intelligence); textile industry; wavelet transforms; Euclidean distance; Euclidean distance based classifier; classification error; classification-oriented features; defect samples; fabric automatic visual inspection; fabric defect classification; fabric image; feature extractor; linear transformation matrix; minimum classification error training; minimum classification error training method; nonoverlapping window; wavelet frames; Design engineering; Euclidean distance; Fabrics; Feature extraction; Image texture analysis; Inspection; Matrix decomposition; Shape; Statistics; Weaving;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the
Conference_Location
Pittsburgh, PA, USA
ISSN
0197-2618
Print_ISBN
0-7803-7420-7
Type
conf
DOI
10.1109/IAS.2002.1044102
Filename
1044102
Link To Document