Title :
Polarimetric wavelet phenomenology of space materials
Author :
Giakos, G.C. ; Picard, R.H. ; Dao, P.D. ; Crabtree, P.N. ; McNicholl, P.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Akron, Akron, OH, USA
Abstract :
This paper describes new polarimetric wavelet detection principles applied to the backscattering characteristics of space materials in the near infrared. Efficient polarimetric detection techniques are combined with cross-correlation and wavelet analysis for enhanced characterization of space materials. The outcome of this study will support remote characterization of space materials and structures with enhanced discrimination, localization, and high-dynamic range while maintaining uncompromised sensitivity.
Keywords :
aerospace materials; backscatter; correlation methods; polarimetry; wavelet transforms; backscattering characteristics; cross-correlation; near infrared; polarimetric detection; polarimetric wavelet detection; space materials; uncompromised sensitivity; wavelet analysis; Amorphous silicon; Correlation; Matrix decomposition; Photovoltaic cells; Wavelet analysis; Wavelet transforms; Polarimetry; Remote Sensing; Space Materials; Wavelet Analysis;
Conference_Titel :
Imaging Systems and Techniques (IST), 2011 IEEE International Conference on
Conference_Location :
Penang
Print_ISBN :
978-1-61284-894-5
DOI :
10.1109/IST.2011.5962233
