DocumentCode :
2403825
Title :
Design and implementation of test-case generation for concurrent programs
Author :
Katayama, Tetsuro ; Furukawa, Zengo ; Ushijima, Kazuo
Author_Institution :
Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
fYear :
1998
fDate :
2-4 Dec 1998
Firstpage :
262
Lastpage :
269
Abstract :
Test-cases play an important role for high quality of software testing. Inadequate test-cases may cause bugs remaining after testing. Overlapped ones lead to the increases in testing costs. This paper proposes the Event InterActions Graph (EIAG) representing behavior of concurrent programs including any task-type and the cooperated paths (copaths) on the EIAG as test-cases, and describes the test-case generation tool (TCgen) for concurrent programs written in Ada programming language. The EIAG consists of Event Graphs and Interactions. An Event Graph is a control flow graph of a program unit in a concurrent program. The interactions represent interactions such as synchronizations between the program units. TCgen generates test-cases as copaths from an Ada concurrent program. The generated copaths satisfy given testing criteria. They can find some communication errors in testing and detecting unreachable statements which concern interactions. It is, however, necessary to validate feasibility of the generated copaths
Keywords :
parallel programming; program testing; synchronisation; Ada programming language; EIAG; TCgen; communication errors; concurrent programs; copaths; event interactions graph representing behavior; software testing; synchronizations; test-case generation; Communication system control; Computer bugs; Computer languages; Costs; Flow graphs; Information science; Sequential analysis; Software systems; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering Conference, 1998. Proceedings. 1998 Asia Pacific
Conference_Location :
Taipei
Print_ISBN :
0-8186-9183-2
Type :
conf
DOI :
10.1109/APSEC.1998.733728
Filename :
733728
Link To Document :
بازگشت