• DocumentCode
    2403962
  • Title

    Change impact analysis for a class hierarchy

  • Author

    Jang, Yoon Kyu ; Chae, Heung Seok ; Kwon, Yong Rae ; Bae, Doo Hwan

  • Author_Institution
    Dept. of Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
  • fYear
    1998
  • fDate
    2-4 Dec 1998
  • Firstpage
    304
  • Lastpage
    311
  • Abstract
    Modified programs are required to be retested to determine whether changes have been made correctly and to investigate whether those cause any adverse effect on the program behavior. Then, the key issue is the extent of the retesting tasks. To save time and efforts, retesting should be done on only the parts that might be affected by changes. Change impact analysis is the activity which identifies the parts to be retested. Object-oriented paradigm is based on several concepts such as encapsulation, inheritance, polymorphism, and dynamic binding. Although these features contribute to the reusability and extensibility of systems, they produce complex dependencies between classes and attributes, which make it difficult to identify the affected components by changes. We propose an approach for analyzing change impact in a class hierarchy. Our approach is based on the class firewall method, but aims to reduce the retesting effort significantly by taking a member function as a test unit. We deal with the impacts of changes associated with various object-oriented features as well as types of changes which can occur at the level of a data member a member function, a class, and an inheritance relation
  • Keywords
    object-oriented methods; object-oriented programming; program diagnostics; change impact analysis; class firewall; class hierarchy; object-oriented features; object-oriented paradigm; program behavior; Computer science; Delay effects; Electrical capacitance tomography; Encapsulation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Conference, 1998. Proceedings. 1998 Asia Pacific
  • Conference_Location
    Taipei
  • Print_ISBN
    0-8186-9183-2
  • Type

    conf

  • DOI
    10.1109/APSEC.1998.733733
  • Filename
    733733