DocumentCode
2404003
Title
Attribute classification using feature analysis
Author
Nauman, F. ; Ho, Ching-Tien ; Tian, Xuqing ; Haas, Laura ; Megiddo, Nimrod
Author_Institution
IBM Almaden Res. Center, San Jose, CA, USA
fYear
2002
fDate
2002
Firstpage
271
Abstract
The basis of many systems that integrate data from multiple sources is a set of correspondences between source schemata and a target schema. Correspondences express a relationship between sets of source attributes, possibly from multiple sources, and a set of target attributes. Clio is an integration tool that assists users in defining value correspondences between attributes. In real life scenarios there may be many sources and the source relations may have many attributes. Users can get lost and might miss or be unable to find some correspondences. Also, in many real life schemata the attribute names reveal little or nothing about the semantics of the data values. Only the data values in the attribute columns can convey the semantic meaning of the attribute. Our work relieves users of the problems of too many attributes and meaningless attribute names, by automatically suggesting correspondences between source and target attributes. For each attribute, we analyze the data values and derive a set of features
Keywords
database management systems; pattern classification; Clio integration tool; attribute classification; feature analysis; multiple sources; source attributes; source schemata; target attributes; target schema; Data engineering; Insurance; Semiconductor device manufacture; Spatial databases; Testing; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Engineering, 2002. Proceedings. 18th International Conference on
Conference_Location
San Jose, CA
ISSN
1063-6382
Print_ISBN
0-7695-1531-2
Type
conf
DOI
10.1109/ICDE.2002.994725
Filename
994725
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