Title :
Testable Switched-Capacitor Filters
Author :
Huertas, J.L. ; Rueda, A. ; Vazquez, D.
Author_Institution :
Dto. Diseno Analogico, Univ. de Sevilla, Sevilla, Spain
Abstract :
A Design for Test methodology for S-C filters is presented, based on an architecture using some additional circuitry and providing extra capabilities for both off-and on-line test. The approach uses a comparison mechanism to indicate whether or not two copies of a filter element (a biquad,for instance) have a similar response during their actual operation. The design and implementation of an integrated filter is included to assess the potential usefulness of this new approach.
Keywords :
switched capacitor filters; S-C filters; filter element; integrated filter; off-line test; on-line test; testable switched-capacitor filters; Analog integrated circuits; Circuit faults; Circuit testing; Design for testability; Design methodology; Filters; Integrated circuit modeling; Integrated circuit testing; Life testing; System testing;
Conference_Titel :
Solid-State Circuits Conference, 1992. ESSCIRC '92. Eighteenth European
Conference_Location :
Copenhagen
Print_ISBN :
87-984232-0-7
DOI :
10.1109/ESSCIRC.1992.5468413
