DocumentCode :
2404285
Title :
Automatic discrimination system for color unevenness in the picture on thin film transistor type of liquid crystal display adapted to the color sensation of dark eyes
Author :
Muraoka, Tetsuya ; Sakai, Naoto ; Tsuchiya, Takehito
Author_Institution :
Polytech. Univ., Kanagawa, Japan
Volume :
3
fYear :
1996
fDate :
5-10 Aug 1996
Firstpage :
1434
Abstract :
The conventional color uneven detectors can detect the pixel defects in the picture on the thin-film transistor liquid crystal display (TFT-LCD), but can not discriminate the color unevenness in this picture. For the solution of the above-mentioned issue, the present study has developed a new automatic discrimination system for color unevenness adapted to dark eyes. The lower and upper limits of the subjective equivalent at the red color stimuli stored in the memory has converted by the 256 tones. The 256 tones used to the division of the red color stimuli is not the wavelengths but the chromaticness. The color unevenness in the picture on the TFT-LCD can be simply discriminated. Using this new automatic discrimination system for color unevenness in the production line, the work process of the color uneven discrimination in the picture on the TFT-LCD is simplified, while such work has been conducted by color sensations of factory workers up to date. Consequently, specialists need not to be employed and also the quality of the products can be employed without my specialist´s intervention. Necessarily, the working efficiency is improved
Keywords :
image colour analysis; liquid crystal displays; thin film transistors; TFT-LCD; automatic discrimination system; color sensations; color unevenness discrimination; dark eyes; pixel defects; red color stimuli; thin-film transistor liquid crystal display; working efficiency; Color; Crosstalk; Detectors; Eyes; Image resolution; Interference; Liquid crystal displays; Production facilities; Production systems; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, Control, and Instrumentation, 1996., Proceedings of the 1996 IEEE IECON 22nd International Conference on
Conference_Location :
Taipei
Print_ISBN :
0-7803-2775-6
Type :
conf
DOI :
10.1109/IECON.1996.570594
Filename :
570594
Link To Document :
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