Title :
Bayesian model for early reliability prediction
Author :
Ion, Roxana A. ; Kalishoek, Hans ; Karydas, Dimitrios M. ; Nitescu, Iulian
Author_Institution :
Eindhoven Univ. of Technol.
Abstract :
This paper provides a Bayesian model for estimating the failure probability in the field, early after a product has been introduced to the market. First, the need for early reliability is recognized. Next, the Bayesian method is briefly explained after which it will be applied to early reliability prediction. Finally, it can be said that the model reduces the uncertainty of the prediction. The presented model has been applied in practice
Keywords :
Weibull distribution; belief networks; failure analysis; reliability; risk analysis; Bayesian model; Weibull distribution; product failure probability; reliability prediction; uncertainty; Bayesian methods; Companies; Cost function; Embedded system; Feedback; Predictive models; Probability distribution; Testing; Uncertainty; Warranties;
Conference_Titel :
Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
Conference_Location :
Newport Beach, CA
Print_ISBN :
1-4244-0007-4
Electronic_ISBN :
0149-144X
DOI :
10.1109/RAMS.2006.1677384
