DocumentCode
2404483
Title
Bayesian model for early reliability prediction
Author
Ion, Roxana A. ; Kalishoek, Hans ; Karydas, Dimitrios M. ; Nitescu, Iulian
Author_Institution
Eindhoven Univ. of Technol.
fYear
2006
fDate
23-26 Jan. 2006
Firstpage
260
Lastpage
265
Abstract
This paper provides a Bayesian model for estimating the failure probability in the field, early after a product has been introduced to the market. First, the need for early reliability is recognized. Next, the Bayesian method is briefly explained after which it will be applied to early reliability prediction. Finally, it can be said that the model reduces the uncertainty of the prediction. The presented model has been applied in practice
Keywords
Weibull distribution; belief networks; failure analysis; reliability; risk analysis; Bayesian model; Weibull distribution; product failure probability; reliability prediction; uncertainty; Bayesian methods; Companies; Cost function; Embedded system; Feedback; Predictive models; Probability distribution; Testing; Uncertainty; Warranties;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
Conference_Location
Newport Beach, CA
ISSN
0149-144X
Print_ISBN
1-4244-0007-4
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2006.1677384
Filename
1677384
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