• DocumentCode
    2404551
  • Title

    Analog-to-digital converter technology comparison

  • Author

    Walden, R.H.

  • Author_Institution
    Hughes Res. Labs., Malibu, CA, USA
  • fYear
    1994
  • fDate
    16-19 Oct. 1994
  • Firstpage
    217
  • Lastpage
    219
  • Abstract
    Analog-to-digital converters are ubiquitous, critical components of signal processing systems. This presentation surveys the state-of-the-art for ADCs and includes both experimental converters and commercially available parts. The shape of the distribution on a resolution vs. sampling rate graph provides insight into ADC performance limitations. For sampling frequencies ranging from /spl sim/0.5 MSPS to /spl sim/4 GSPS, resolution falls off by /spl sim/1 bit for every doubling of the sampling rate. This effect can be related to aperture jitter. For ADCs operating at /spl ges/4 GSPS, the speed of the device technology is a limiting factor. In order to push back these limits, many ADC architectures have been proposed and implemented.
  • Keywords
    analogue-digital conversion; jitter; signal sampling; ADC performance limitations; ADC technology comparison; analog-to-digital converters; aperture jitter; resolution; sampling rate; Analog-digital conversion; Apertures; Frequency; Jitter; Limiting; Sampling methods; Shape; Signal processing; Signal resolution; Signal sampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1994. Technical Digest 1994., 16th Annual
  • Conference_Location
    Phildelphia, PA, USA
  • ISSN
    1064-7775
  • Print_ISBN
    0-7803-1975-3
  • Type

    conf

  • DOI
    10.1109/GAAS.1994.636970
  • Filename
    636970