DocumentCode :
2404551
Title :
Analog-to-digital converter technology comparison
Author :
Walden, R.H.
Author_Institution :
Hughes Res. Labs., Malibu, CA, USA
fYear :
1994
fDate :
16-19 Oct. 1994
Firstpage :
217
Lastpage :
219
Abstract :
Analog-to-digital converters are ubiquitous, critical components of signal processing systems. This presentation surveys the state-of-the-art for ADCs and includes both experimental converters and commercially available parts. The shape of the distribution on a resolution vs. sampling rate graph provides insight into ADC performance limitations. For sampling frequencies ranging from /spl sim/0.5 MSPS to /spl sim/4 GSPS, resolution falls off by /spl sim/1 bit for every doubling of the sampling rate. This effect can be related to aperture jitter. For ADCs operating at /spl ges/4 GSPS, the speed of the device technology is a limiting factor. In order to push back these limits, many ADC architectures have been proposed and implemented.
Keywords :
analogue-digital conversion; jitter; signal sampling; ADC performance limitations; ADC technology comparison; analog-to-digital converters; aperture jitter; resolution; sampling rate; Analog-digital conversion; Apertures; Frequency; Jitter; Limiting; Sampling methods; Shape; Signal processing; Signal resolution; Signal sampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1994. Technical Digest 1994., 16th Annual
Conference_Location :
Phildelphia, PA, USA
ISSN :
1064-7775
Print_ISBN :
0-7803-1975-3
Type :
conf
DOI :
10.1109/GAAS.1994.636970
Filename :
636970
Link To Document :
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