DocumentCode
2404551
Title
Analog-to-digital converter technology comparison
Author
Walden, R.H.
Author_Institution
Hughes Res. Labs., Malibu, CA, USA
fYear
1994
fDate
16-19 Oct. 1994
Firstpage
217
Lastpage
219
Abstract
Analog-to-digital converters are ubiquitous, critical components of signal processing systems. This presentation surveys the state-of-the-art for ADCs and includes both experimental converters and commercially available parts. The shape of the distribution on a resolution vs. sampling rate graph provides insight into ADC performance limitations. For sampling frequencies ranging from /spl sim/0.5 MSPS to /spl sim/4 GSPS, resolution falls off by /spl sim/1 bit for every doubling of the sampling rate. This effect can be related to aperture jitter. For ADCs operating at /spl ges/4 GSPS, the speed of the device technology is a limiting factor. In order to push back these limits, many ADC architectures have been proposed and implemented.
Keywords
analogue-digital conversion; jitter; signal sampling; ADC performance limitations; ADC technology comparison; analog-to-digital converters; aperture jitter; resolution; sampling rate; Analog-digital conversion; Apertures; Frequency; Jitter; Limiting; Sampling methods; Shape; Signal processing; Signal resolution; Signal sampling;
fLanguage
English
Publisher
ieee
Conference_Titel
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1994. Technical Digest 1994., 16th Annual
Conference_Location
Phildelphia, PA, USA
ISSN
1064-7775
Print_ISBN
0-7803-1975-3
Type
conf
DOI
10.1109/GAAS.1994.636970
Filename
636970
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