• DocumentCode
    2404607
  • Title

    Accelerated life tests at higher usage rates: a case study

  • Author

    Yang, Guangbin ; Zaghati, Z.

  • Author_Institution
    Ford Motor Co., Dearborn, MI
  • fYear
    2006
  • fDate
    23-26 Jan. 2006
  • Firstpage
    313
  • Lastpage
    317
  • Abstract
    The life of some products is measured by usage, e.g., cycles and mileage. Such products are usually operated at a low usage rate in the field. Accelerated life testing of the products often involves the concurrent use of increased usage rate and other stresses. The effects of increasing the usage rate on usage to failure (life) are usually ignored. In fact, increasing the usage rate may shorten or prolong the life. A generic method for accelerated life tests at higher usage rates is described in Ref. 1. Using the method, this paper presents a case study on demonstrating the reliability of a type of compact relays, whose life testing uses increased switching rates. In particular, we develop the component-specific acceleration model, test method, and best compromise plan. Life data analysis using the maximum likelihood method concludes that the compact relays marginally meet the reliability requirement. In addition, this paper evaluates the significance of the switching rate effect and shows that the effect cannot be ignored
  • Keywords
    Weibull distribution; failure analysis; life testing; product design; product life cycle management; reliability; Arrhenius relationship; Weibull distribution; accelerated life testing; failure cycles; generic method; reliability; Acceleration; Computer aided software engineering; Data analysis; Life estimation; Life testing; Manufacturing; Maximum likelihood estimation; Relays; Stress; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
  • Conference_Location
    Newport Beach, CA
  • ISSN
    0149-144X
  • Print_ISBN
    1-4244-0007-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2006.1677393
  • Filename
    1677393