Analysis of detailed patterns of contour shapes using wavelet local extrema

We propose a method to analyze detailed patterns on contour shapes. In this method, we express detailed patterns using wavelet local extrema which are obtained through wavelet transforms. Based on this description, two features of detailed patterns, the properties of small fractions (or corners) constituting the detailed patterns and the arrangement of these corners are extracted. Using these two important features, the similarities between two detailed patterns can be examined. The proposed method is applied to detailed patterns of leaf contours and some hand-drawn contours to show its feasibility