Reliability analysis of aged components

Author

Soto, E. ; Marcos, J. ; Villagrasa, S. ; Fernández, S.

Author_Institution

Dept. of Electron. Technol., Vigo Univ.

fYear

2006

fDate

23-26 Jan. 2006

Firstpage

396

Lastpage

401

Abstract

Our research is mainly focused in reliability prediction for components and systems used in industrial environments. We use accelerated life testing as the main tool for our calculations. However, the questions of how components age over an extended period of time, and the possible differences with aging through accelerated testing, have always intrigued us. We have obtained a large sample of integrated TTL and CMOS components from a recently upgraded industrial facility. All components have been under uninterrupted operation, 24times7, for over 30 years. We have characterized and analyzed them, gaining some insight in their aging process, as described in this paper

Keywords

ageing; electronic products; life testing; reliability; CMOS components; TTL components; accelerated life testing; aged components; aging process; industrial environments; reliability analysis; Aging; CMOS technology; Circuit testing; Current measurement; Data analysis; Failure analysis; Life estimation; Life testing; Software testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability and Maintainability Symposium, 2006. RAMS '06. Annual

Conference_Location

Newport Beach, CA

ISSN

0149-144X

Print_ISBN

1-4244-0007-4

Electronic_ISBN

0149-144X

Type

conf

DOI

10.1109/RAMS.2006.1677407

Filename

1677407