Title :
Reliability analysis of aged components
Author :
Soto, E. ; Marcos, J. ; Villagrasa, S. ; Fernández, S.
Author_Institution :
Dept. of Electron. Technol., Vigo Univ.
Abstract :
Our research is mainly focused in reliability prediction for components and systems used in industrial environments. We use accelerated life testing as the main tool for our calculations. However, the questions of how components age over an extended period of time, and the possible differences with aging through accelerated testing, have always intrigued us. We have obtained a large sample of integrated TTL and CMOS components from a recently upgraded industrial facility. All components have been under uninterrupted operation, 24times7, for over 30 years. We have characterized and analyzed them, gaining some insight in their aging process, as described in this paper
Keywords :
ageing; electronic products; life testing; reliability; CMOS components; TTL components; accelerated life testing; aged components; aging process; industrial environments; reliability analysis; Aging; CMOS technology; Circuit testing; Current measurement; Data analysis; Failure analysis; Life estimation; Life testing; Software testing; Voltage;
Conference_Titel :
Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
Conference_Location :
Newport Beach, CA
Print_ISBN :
1-4244-0007-4
Electronic_ISBN :
0149-144X
DOI :
10.1109/RAMS.2006.1677407
