• DocumentCode
    2404881
  • Title

    BDD based analysis of parametric fault trees

  • Author

    Codetta-Raiteri, D.

  • Author_Institution
    Dipt. di Informatica, Torino Univ.
  • fYear
    2006
  • fDate
    23-26 Jan. 2006
  • Firstpage
    442
  • Lastpage
    449
  • Abstract
    Several extensions of the fault tree (FT) formalism have been proposed in the literature. One of them is called parametric fault tree (PFT) and is oriented to the modeling of redundant systems, and provides a compact form to model the redundant parts of the system. Using PFTs instead of FTs to model systems with replicated parts, the model design is simplified since the analyst can fold subtrees with the same structure in a single parametric subtree, reducing the number of elements in the model. The method based on binary decision diagrams (BDD) for the quantitative analysis of FTs, is adapted in this paper to cope with the parametric form of PFTs: an extension of BDDs called parametric BDD (pBDD) is used to analyze PFTs. The solution process is simplified by using pBDDs: comparing the pBDD obtained from a PFT, with the ordinary BDD obtained from the unfolded FT, we can observe a reduction of the number of nodes inside the pBDD. Such reduction is proportional to the level of redundancy inside the PFT and leads to a consequent reduction of the number of steps necessary to perform the analysis. Concerning the qualitative analysis, we can observe that several minimal cut sets (MCS) obtained from the FT model of a redundant system, involve basic events relative to similar components. A parametric MCS (pMCS) allows to group such MCSs in an equivalence class, and consequently, to evidence only the failure pattern, regardless the identity of replicated components. A method to derive pMCSs from a PFT is provided in the paper
  • Keywords
    binary decision diagrams; fault trees; reliability theory; binary decision diagram; equivalence class; failure pattern; minimal cut set; parametric fault tree; parametric subtree; redundant system; replicator component; Binary decision diagrams; Boolean functions; Data structures; Fault trees; Performance analysis; Petri nets; Redundancy; State-space methods; Stochastic processes; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
  • Conference_Location
    Newport Beach, CA
  • ISSN
    0149-144X
  • Print_ISBN
    1-4244-0007-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2006.1677414
  • Filename
    1677414