Title :
A double-double balanced HBT Schottky diode broadband mixer at X-band
Author :
Kobayashi, K.W. ; Kasody, R. ; Oki, A.K. ; Dow, G.S. ; Allen, B. ; Streit, D.C.
Author_Institution :
Electron. Syst. & Technol. Div., TRW Inc., Redondo Beach, CA, USA
Abstract :
A Schottky diode double-double balanced mixer with 10 dB conversion loss and >60 dB LO-IF isolation has been achieved using AlGaAs/GaAs HBTs. The HBT Schottky mixer converts a 6-10 GHz RF signal down to a 2-6 GHz IF band with a fixed LO of 10 dBm at 12 GHz. The IP3 is as high as 11 dBm at this LO drive level. An up-conversion loss of <10 dB was also measured with an IP3 of as much as 12 dBm at midband. The Schottky diodes were constructed by making a Schottky contact to the HBT MBE N/sup -/ collector layer. The resulting Schottky diodes obtain a cut-off frequency of 1 THz and an ideality factor=1.05. The same HBT process yields an f/sub T/ and f/sub max/ of 23 GHz and 50 GHz, respectively, for a 2 /spl mu/m emitter width Self-Aligned Base Ohmic Metal HBT. The work in this paper represents the first double-double balanced HBT Schottky diode mixer demonstration and achieves superior performance to a previously published double-double balanced X-band MESFET Schottky mixer.
Keywords :
III-V semiconductors; MMIC mixers; Schottky diode mixers; aluminium compounds; bipolar MMIC; gallium arsenide; heterojunction bipolar transistors; 10 dB; 2 micron; 2 to 12 GHz; 23 GHz; 50 GHz; AlGaAs-GaAs; HBT; LO-IF isolation; Schottky contact; Schottky diode broadband mixer; X-band; cut-off frequency; double-double balanced mixer; ideality factor; self-aligned base ohmic metal; up-conversion loss; Cutoff frequency; Foundries; Frequency conversion; Gallium arsenide; Heterojunction bipolar transistors; Isolation technology; Mixers; Molecular beam epitaxial growth; Phase noise; Schottky diodes;
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1994. Technical Digest 1994., 16th Annual
Conference_Location :
Phildelphia, PA, USA
Print_ISBN :
0-7803-1975-3
DOI :
10.1109/GAAS.1994.636992