Title :
An auto-scaling ruler for the L-EditTM layout editor implemented using L-Edit/UPITM subroutine library
Author :
Crisu, Dan ; Dan, Claudius
Author_Institution :
Lab. of Microelectron. Syst., Bucharest Politehnica Univ., Romania
Abstract :
A new software implementation of an auto-scaling ruler with respect to technology units for measuring layout spacing is presented. It extends the capabilities of the L-Edit layout editor, enabling the designer to focus on real work and not to count down and do basic arithmetic with internal units and grid settings
Keywords :
circuit layout CAD; software libraries; L-Edit layout editor; L-Edit/UPI subroutine library; auto-scaling ruler; circuit design; computer software; Algorithms; Fabrication; Integrated circuit layout; Laboratories; Libraries; Microelectronics; Micromechanical devices; Packaging; Process design; Semiconductor device measurement;
Conference_Titel :
Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-4432-4
DOI :
10.1109/SMICND.1998.733792
