DocumentCode :
2405075
Title :
Opportunities and challenges of III-V nanoelectronics for future high-speed, low-power logic applications
Author :
Chau, Robert ; Datta, Suman ; Majumdar, Amlan
Author_Institution :
Components Res., Technol. & Manuf. Group, Intel Corp., Hillsboro, OR, USA
fYear :
2005
fDate :
30 Oct.-2 Nov. 2005
Abstract :
This paper highlights the opportunities and challenges of III-V nanoelectronics for future high-speed, low- power digital logic applications. III-V materials in general have significantly higher electron mobility than Si and can potentially play a major role along with Si in future high-speed, low-power computing. The major potential advantage of using a III-V quantum-well field-effect transistor as a logic transistor is that it can be operated under very low supply voltage (e.g., 0.5 V), and hence, lower power dissipation while still achieving very high speed. Compared to other emerging high-mobility materials, such as, carbon nanotubes and semiconductor nanowires, which require "bottom-up" chemical synthesis for formation and suffer from the fundamental placement problem, III-V materials are far more practical in terms of patterning. However, many significant challenges remain to be overcome before III-V materials become applicable for future high-speed, low-power logic applications. These include: (i) finding a compatible high-K gate dielectric on III-Vs, (ii) demonstrating gate length scalability below 35 nm with acceptable ION/IOFF ratio, (iii) improving the hole mobility in III-Vs or finding the right p-channel FET for the complementary metal-oxide-semiconductor (CMOS) configuration, and (iv) integrating III-V materials onto the Si substrate.
Keywords :
III-V semiconductors; carbon nanotubes; field effect logic circuits; high electron mobility transistors; high-k dielectric thin films; high-speed techniques; low-power electronics; nanoelectronics; semiconductor quantum wells; silicon; CMOS configuration; III-V field-effect transistor; III-V materials; III-V nanoelectronics; carbon nanotubes; gate length scalability; high-K gate dielectric; high-speed digital logic applications; high-speed logic applications; higher electron mobility; logic transistor; low- power digital logic applications; low-power logic applications; p-channel FET; quantum-well field-effect transistor; semiconductor nanowires; Dielectric materials; Electron mobility; FETs; High K dielectric materials; III-V semiconductor materials; Logic; Low voltage; Nanoelectronics; Organic materials; Quantum wells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium, 2005. CSIC '05. IEEE
Print_ISBN :
0-7803-9250-7
Type :
conf
DOI :
10.1109/CSICS.2005.1531740
Filename :
1531740
Link To Document :
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