• DocumentCode
    2405165
  • Title

    A frequency agile 40 Gb/s half rate linear phase detector for data jitter measurement

  • Author

    Karlquist, Richard ; Marshall, Todd ; Tuyl, R.V. ; Hutchinson, Craig

  • Author_Institution
    Agilent Technol., Palo Alto, CA, USA
  • fYear
    2005
  • fDate
    30 Oct.-2 Nov. 2005
  • Abstract
    A 40 Gb/s half-rate linear phase detector IC for NRZ data, implemented in a 200 GHz fT, InP DHBT process, with a novel architecture, is described. The IC can be used for clock recovery or jitter measurement. The new architecture has less critical internal timing, and better speed and linearity than previous phase detectors. Half rate operation doubles the allowable propagation delay. Dual outputs alternate in time and combine linearly, allowing overlap without error, resulting in greater linear range. Operation at any rate is possible because no rate-specific delay lines are used. The intrinsic jitter for a 40 Gb/s 231-1 PRBS pattern is 50 mUl pk-pk in a 320 MHz bandwidth.
  • Keywords
    III-V semiconductors; data communication; frequency agility; heterojunction bipolar transistors; indium compounds; jitter; phase detectors; synchronisation; 200 GHz; 320 MHz; 40 Gbit/s; DHBT process; InP; NRZ data; clock recovery; data communication; data jitter measurement; frequency agile; half rate linear phase detector; Clocks; Frequency measurement; Indium phosphide; Jitter; Linearity; Optical signal processing; Phase detection; Phase frequency detector; Phase measurement; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium, 2005. CSIC '05. IEEE
  • Print_ISBN
    0-7803-9250-7
  • Type

    conf

  • DOI
    10.1109/CSICS.2005.1531747
  • Filename
    1531747