Title :
A novel safety-critical system modeling approach: ternary decision diagram
Author :
Yu, Yangyang ; Johnson, Barry W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Univ., Charlottesville, VA
Abstract :
In this paper safety-critical computer systems are broken down to functional modules. ternary decision diagram (TDD) is introduced to model these modules. Four cases of module construction techniques using TDD are discussed. For some dynamic modules that cannot be directly represented by TDD, the solution of the Markov model of the module provides the information for a single node TDD construction. The system level TDD is composed of the TDD of each functional module by the ORed combinatorial relationship. The system-coverage and the mean time to unsafe failure (MTTUF) are estimated via the system level TDD. An algorithm is proposed for the modular approach, and an example is utilized to verify the algorithm
Keywords :
Markov processes; combinational circuits; decision diagrams; fault tolerant computing; fault trees; logic design; safety-critical software; Markov model; ORed combinatorial relationship; algorithm verification; functional modules; module construction technique; safety-critical computer system modeling; system level ternary decision diagram; system-coverage; unsafe failure mean time; Condition monitoring; Fault detection; Fault tolerant systems; Hardware; Modeling; Modular construction; Redundancy; Safety; Signal processing;
Conference_Titel :
Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
Conference_Location :
Newport Beach, CA
Print_ISBN :
1-4244-0007-4
Electronic_ISBN :
0149-144X
DOI :
10.1109/RAMS.2006.1677436