• DocumentCode
    2405280
  • Title

    A novel safety-critical system modeling approach: ternary decision diagram

  • Author

    Yu, Yangyang ; Johnson, Barry W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Virginia Univ., Charlottesville, VA
  • fYear
    2006
  • fDate
    23-26 Jan. 2006
  • Firstpage
    582
  • Lastpage
    587
  • Abstract
    In this paper safety-critical computer systems are broken down to functional modules. ternary decision diagram (TDD) is introduced to model these modules. Four cases of module construction techniques using TDD are discussed. For some dynamic modules that cannot be directly represented by TDD, the solution of the Markov model of the module provides the information for a single node TDD construction. The system level TDD is composed of the TDD of each functional module by the ORed combinatorial relationship. The system-coverage and the mean time to unsafe failure (MTTUF) are estimated via the system level TDD. An algorithm is proposed for the modular approach, and an example is utilized to verify the algorithm
  • Keywords
    Markov processes; combinational circuits; decision diagrams; fault tolerant computing; fault trees; logic design; safety-critical software; Markov model; ORed combinatorial relationship; algorithm verification; functional modules; module construction technique; safety-critical computer system modeling; system level ternary decision diagram; system-coverage; unsafe failure mean time; Condition monitoring; Fault detection; Fault tolerant systems; Hardware; Modeling; Modular construction; Redundancy; Safety; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
  • Conference_Location
    Newport Beach, CA
  • ISSN
    0149-144X
  • Print_ISBN
    1-4244-0007-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2006.1677436
  • Filename
    1677436