DocumentCode
2405443
Title
Metamaterials and imaging with sub-wavelength resolution
Author
Zhang, Yuan ; Zhang, Daohua ; Fiddy, Michael A.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
fDate
14-16 Dec. 2010
Firstpage
1
Lastpage
4
Abstract
We examine the possible use of a planar negative index superlens to recover subwavelength scale information about a three dimensional penetrable object. In particular, we analyze the role of the amplified evanescent waves and show that it may not be possible to get high resolution in three dimensions from one experiment. There is trade-off between the transverse and longitudinal resolution one can obtain.
Keywords
image resolution; lenses; metamaterials; amplified evanescent waves; longitudinal resolution; metamaterials; planar negative index superlens; subwavelength resolution; three dimensional penetrable object; transverse resolution; Image resolution; Imaging; Indexes; Lenses; Metamaterials; Optical diffraction; Three dimensional displays; negative refraction; super resolution; superlens;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics Global Conference (PGC), 2010
Conference_Location
Singapore
Print_ISBN
978-1-4244-9882-6
Type
conf
DOI
10.1109/PGC.2010.5706003
Filename
5706003
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