Title :
Metamaterials and imaging with sub-wavelength resolution
Author :
Zhang, Yuan ; Zhang, Daohua ; Fiddy, Michael A.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
We examine the possible use of a planar negative index superlens to recover subwavelength scale information about a three dimensional penetrable object. In particular, we analyze the role of the amplified evanescent waves and show that it may not be possible to get high resolution in three dimensions from one experiment. There is trade-off between the transverse and longitudinal resolution one can obtain.
Keywords :
image resolution; lenses; metamaterials; amplified evanescent waves; longitudinal resolution; metamaterials; planar negative index superlens; subwavelength resolution; three dimensional penetrable object; transverse resolution; Image resolution; Imaging; Indexes; Lenses; Metamaterials; Optical diffraction; Three dimensional displays; negative refraction; super resolution; superlens;
Conference_Titel :
Photonics Global Conference (PGC), 2010
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-9882-6
DOI :
10.1109/PGC.2010.5706003
