Title :
Estimation of maximum power-up current
Author :
Li, Fei ; He, Lei ; Saluja, Kewal K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
Power gating is emerging as a viable solution to reduction of leakage current. However, power gated circuits are different from the conventional designs in the sense that a power-gated circuit must be brought to a valid state from the power-off state, when all nodes in the circuit are at logic zero state, before useful computation can begin. Thus, estimation of the maximum current in a power gated circuit must determine the maximum of all possible power-up and normal switching current. In this paper we propose a cluster-based ATPG algorithm to estimate the maximum power-up current for combinational circuits. Our method achieves substantial improvement over simulation-based methods and also over the previously proposed ATPG-based methods. Further we also formulate the sequential circuit maximum current problem as a combinational ATPG problem, and solve it using the cluster-based estimation algorithm. Experimental results show that the maximum power-up current for sequential circuits can be up to 73% larger than the maximum normal switching current
Keywords :
automatic test pattern generation; combinational circuits; integrated circuit testing; integrated logic circuits; leakage currents; logic testing; low-power electronics; sequential circuits; cluster-based ATPG algorithm; cluster-based estimation algorithm; combinational ATPG problem; combinational circuits; leakage current reduction; maximum power-up current estimation; power gated circuits; power gating; sequential circuit maximum current problem; Automatic test pattern generation; Circuit simulation; Clustering algorithms; Combinational circuits; Computational modeling; Leakage current; Logic circuits; Logic design; Sequential circuits; Switching circuits;
Conference_Titel :
Design Automation Conference, 2002. Proceedings of ASP-DAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design. Proceedings.
Conference_Location :
Bangalore
Print_ISBN :
0-7695-1441-3
DOI :
10.1109/ASPDAC.2002.994884