2405650

2002 IEEE International SOI Conference. Proceedings (Cat. No.02CH37347)

2002

7-10 Oct. 2002

MOS analogue integrated circuits; MOS integrated circuits; elemental semiconductors; integrated circuit modelling; integrated circuit reliability; mixed analogue-digital integrated circuits; semiconductor device reliability; silicon; silicon-on-insulator; RF circuits; SOI circuits; SOI devices; SOI materials processing; Si-SiO/sub 2/; analog circuits; circuit techniques; mixed mode circuits; modelling; reliability; simulation;

English

ieee

SOI Conference, IEEE International 2002

Williamsburg, VA, USA

0-7803-7439-8

conf

10.1109/SOI.2002.1044395

1044395