DocumentCode :
2405651
Title :
Fabrication of single-layer metamaterials with sub-50-nm ultrasmall gaps
Author :
Guangyuan, Si ; Mingsheng, Zhang ; Lang, Teo Siew ; Jinghua, Teng ; Danner, Aaron J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
fYear :
2010
fDate :
14-16 Dec. 2010
Firstpage :
1
Lastpage :
3
Abstract :
Metamaterials are artificial electromagnetic structures that can have a negative refractive-index, not available in nature. Until now, many different structures have been investigated and considerable approaches have been realized. However, fabrication of metamaterials is still a critical issue due to the difficulty of etching metals especially when the structure dimension is reduced. In this letter, we demonstrate the development of fabricating metamaterials with ultrasmall gap apertures. Novel geometries fabricated in optically thick metallic films are shown. Nanorod structures with different shapes are also developed. Common problems for FIB milling like redeposition and tapered profiles are discussed.
Keywords :
focused ion beam technology; gold; metallic thin films; metamaterials; milling; nanofabrication; nanorods; optical materials; titanium; Au; FIB milling; Ti; artificial electromagnetic structures; etching; nanorod structures; negative refractive index; optically thick metallic films; redeposition; single-layer metamaterials; tapered profiles; ultrasmall gap apertures; Etching; Fabrication; Gratings; Ion beams; Metamaterials; Milling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics Global Conference (PGC), 2010
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-9882-6
Type :
conf
DOI :
10.1109/PGC.2010.5706013
Filename :
5706013
Link To Document :
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