Title :
Using linear cellular automata with memory layer in BIST
Author :
Dascalu, Monica ; Franti, Eduard ; Miloiu, Monica
Author_Institution :
Dept. of Electron., Politehnica Univ., Bucharest, Romania
Abstract :
Built-In Self Test is a basic requirement for high performances microelectronic products. The design of good BIST structures and schemes is a discipline by itself. This paper presents the features of cellular automata chat recommend their use in BIST, especially as test pattern generators. Different pseudo-random sequence generators with cellular automata are presented, together with their properties
Keywords :
built-in self test; cellular automata; integrated circuit testing; BIST; built-in self test; linear cellular automata; memory layer; microelectronic product; pseudo-random sequence generator; test pattern generator; Automata; Automatic testing; Built-in self-test; Circuit testing; Electronic equipment testing; Logic testing; Microelectronics; Packaging; System testing; Test pattern generators;
Conference_Titel :
Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-4432-4
DOI :
10.1109/SMICND.1998.733830
