• DocumentCode
    2405868
  • Title

    Integrated Cu-based TM-pass polarizer using CMOS technology platform

  • Author

    Ng, Tien K. ; Khan, Zahed M. ; Ooi, Boon S.

  • Author_Institution
    Division of Physical Sciences and Engineering, King Abdullah University of Science & Technology (KAUST), Thuwal 23955-6900, Saudi Arabia
  • fYear
    2010
  • fDate
    14-16 Dec. 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A transverse-magnetic-pass (TM-pass) copper (Cu) polarizer is proposed and analyzed using the previously published two-dimensional Method-of-Lines beam-propagation model. The proposed polarizer exhibits a simulated high-pass filter characteristics, with TM0 and TE0 mode transmissivity of >70% and <5%, respectively, in the wavelength regime of 1.2–1.6 μm. The polarization extinction ratio (PER) given by 10 log10 (PTM0)/(PTE0) is +11.5 dB across the high-pass wavelength regime. To the best of the authors´ knowledge, we report here the smallest footprint CMOS-platform compatible TM-polarizer.
  • Keywords
    Copper; Integrated optics; Optical filters; Optical imaging; Optical polarization; Optical sensors; Optical waveguides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Global Conference (PGC), 2010
  • Conference_Location
    Orchard, Singapore
  • Print_ISBN
    978-1-4244-9882-6
  • Type

    conf

  • DOI
    10.1109/PGC.2010.5706025
  • Filename
    5706025
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2405868