Title :
Integrated Cu-based TM-pass polarizer using CMOS technology platform
Author :
Ng, Tien K. ; Khan, Zahed M. ; Ooi, Boon S.
Author_Institution :
Division of Physical Sciences and Engineering, King Abdullah University of Science & Technology (KAUST), Thuwal 23955-6900, Saudi Arabia
Abstract :
A transverse-magnetic-pass (TM-pass) copper (Cu) polarizer is proposed and analyzed using the previously published two-dimensional Method-of-Lines beam-propagation model. The proposed polarizer exhibits a simulated high-pass filter characteristics, with TM0 and TE0 mode transmissivity of >70% and <5%, respectively, in the wavelength regime of 1.2–1.6 μm. The polarization extinction ratio (PER) given by 10 log10 (PTM0)/(PTE0) is +11.5 dB across the high-pass wavelength regime. To the best of the authors´ knowledge, we report here the smallest footprint CMOS-platform compatible TM-polarizer.
Keywords :
Copper; Integrated optics; Optical filters; Optical imaging; Optical polarization; Optical sensors; Optical waveguides;
Conference_Titel :
Photonics Global Conference (PGC), 2010
Conference_Location :
Orchard, Singapore
Print_ISBN :
978-1-4244-9882-6
DOI :
10.1109/PGC.2010.5706025