Title :
High phase accuracy on-wafer measurement for quadrature voltage-controlled oscillator
Author :
Chang, Yin-Cheng ; Chiu, Yin-Chung ; Lin, Shuw-Guann ; Juang, Ying-Zong ; Chiou, Hwann-Kaeo
Author_Institution :
Nat. Appl. Res. Lab., Hsinchu
Abstract :
An on-wafer measurement technique is proposed to characterize the phase accuracy of QVCO. The procedure of calibration and measurement is illustrated in details. An I/Q phase error of a QVCO was precisely measured using the receiver mode of VNA. An on-chip Cal Kit was designed and fabricated for de-embedding system error. A 5 GHz QVCO was then tested to demonstrate the feasibility of measurement and showed excellent quadrature accuracy within 1deg.
Keywords :
integrated circuit measurement; microwave oscillators; voltage-controlled oscillators; I/Q phase error; frequency 5 GHz; on-chip Cal Kit; on-wafer measurement; phase accuracy; phase calibration; quadrature voltage-controlled oscillator; receiver mode; Calibration; Frequency; Instruments; Measurement techniques; Phase measurement; Q measurement; Semiconductor device measurement; Testing; Transceivers; Voltage-controlled oscillators; QVCO; phase calibration; phase error; quadrature accuracy;
Conference_Titel :
Microwave Conference, 2007. European
Conference_Location :
Munich
Print_ISBN :
978-2-87487-001-9
DOI :
10.1109/EUMC.2007.4405196
