High phase accuracy on-wafer measurement for quadrature voltage-controlled oscillator

Author

Chang, Yin-Cheng ; Chiu, Yin-Chung ; Lin, Shuw-Guann ; Juang, Ying-Zong ; Chiou, Hwann-Kaeo

Author_Institution

Nat. Appl. Res. Lab., Hsinchu

fYear

2007

fDate

9-12 Oct. 2007

Firstpage

340

Lastpage

343

Abstract

An on-wafer measurement technique is proposed to characterize the phase accuracy of QVCO. The procedure of calibration and measurement is illustrated in details. An I/Q phase error of a QVCO was precisely measured using the receiver mode of VNA. An on-chip Cal Kit was designed and fabricated for de-embedding system error. A 5 GHz QVCO was then tested to demonstrate the feasibility of measurement and showed excellent quadrature accuracy within 1deg.

Keywords

integrated circuit measurement; microwave oscillators; voltage-controlled oscillators; I/Q phase error; frequency 5 GHz; on-chip Cal Kit; on-wafer measurement; phase accuracy; phase calibration; quadrature voltage-controlled oscillator; receiver mode; Calibration; Frequency; Instruments; Measurement techniques; Phase measurement; Q measurement; Semiconductor device measurement; Testing; Transceivers; Voltage-controlled oscillators; QVCO; phase calibration; phase error; quadrature accuracy;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2007. European

Conference_Location

Munich

Print_ISBN

978-2-87487-001-9

Type

conf

DOI

10.1109/EUMC.2007.4405196

Filename

4405196

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2406038