Title :
Correlation between noise-after-write and magnetizationdynamics in thin film heads
Author :
Liu, F.H. ; Ryan, P.J. ; Shi, X. ; Kryder, M.H.
Author_Institution :
Carnegie Mellon University
Keywords :
Annealing; Kerr effect; Magnetic force microscopy; Magnetic heads; Magnetic noise; Magnetization; Noise figure; Noise level; Transistors; Writing;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696185
