• DocumentCode
    2406219
  • Title

    Deterioration of silicone rubber for polymer insulators by corona discharge and effect of fillers

  • Author

    Koshino, Yukihiro ; Umeda, Itsuki ; Ishiwari, M.

  • Author_Institution
    Polymer Insulator Div., NGK Insulators Ltd., Nagoya, Japan
  • Volume
    1
  • fYear
    1998
  • fDate
    25-28 Oct 1998
  • Firstpage
    72
  • Abstract
    This paper describes deterioration phenomena and mechanisms on silicone rubber housings of the polymer insulators by corona discharges. The corona discharge was observed on the trunk portion the insulator tested in a fog chamber. Nitric acid and ozone generated by the corona discharge were recognized on that trunk portion, which was discolored and became whitish. The discolored area was expanded with test period. Surface conditions and mechanical properties of six kinds of the silicone rubber containing ATH (Alumina Tri-Hydrate) and CaCO3 (Calcium Carbonate) as fillers, were investigated after immersion in 1 N nitric acid for 96 hours. As a result, weight loss of test pieces containing CaCO3 and ATH fillers was more than those solely containing ATH. Cracks were observed on the surface of two specimens containing CaCO3 filler, and not observed on that not containing CaCO3 filler. This shows the cracks on the surface due to corona discharges are depending on the kind of the filler. The careful survey on the deterioration of the housing rubber due to the corona discharge should be done when we select the housing materials for the polymer insulators
  • Keywords
    corona; filled polymers; polymer insulators; silicone rubber; ATH filler; CaCO3 filler; corona discharge; fog chamber testing; mechanical properties; nitric acid; ozone; polymer insulator; silicone rubber housing; surface crack; Corona; Dielectrics and electrical insulation; IEC standards; Insulation life; Plastic insulation; Polymers; Rubber; Silicon compounds; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1998. Annual Report. Conference on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-5035-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1998.733853
  • Filename
    733853