DocumentCode :
2406333
Title :
The state-of-the-art of silicon-on-sapphire CMOS RF switches
Author :
Kelly, Dylan ; Brindle, Chris ; Kemerling, Clint ; Stuber, Mike
Author_Institution :
Peregrine Semicond. Corp., San Diego, CA, USA
fYear :
2005
fDate :
30 Oct.-2 Nov. 2005
Abstract :
Silicon-on-Sapphire (SOS) CMOS FETs have many properties which are desirable for RF switch applications. By being manufactured on an insulating sapphire substrate, the bulk parasitic capacitances typical of CMOS FETs are eliminated. The SOS FET has a very low Ron-Coff product, allowing for low insertion loss and high isolation in high frequency applications. Despite the low breakdown voltage intrinsic to Si, SOS FETs can be stacked in series to withstand high voltages when biased in subthreshold. This work studies the tradeoffs of SOS RF switch design and compares SOS against other technologies such as GaAs and Si-based SOI. Also presented is a high power SP6T switch with insertion loss of 0.6 dB at 2 GHz and isolation of 40 dB at 2 GHz. The presented switch has the highest linearity reported to date of any SP6T switch with a P1dB of 20 W and OIP3 of <+70 dBm.
Keywords :
CMOS integrated circuits; field effect transistors; gallium arsenide; sapphire; semiconductor switches; silicon; 0.6 dB; 2 GHz; 20 W; Al2O3-Si; GaAs; Ron-Coff product; SP6T switch; breakdown voltage; bulk parasitic capacitances; field effect transistors; insertion loss; silicon-on-sapphire CMOS RF switches; Breakdown voltage; FETs; Gallium arsenide; Insertion loss; Insulation; Isolation technology; Manufacturing; Parasitic capacitance; Radio frequency; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium, 2005. CSIC '05. IEEE
Print_ISBN :
0-7803-9250-7
Type :
conf
DOI :
10.1109/CSICS.2005.1531812
Filename :
1531812
Link To Document :
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